Search for "low-energy electron microscopy (LEEM)" in Full Text gives 3 result(s) in Beilstein Journal of Nanotechnology.
Beilstein J. Nanotechnol. 2022, 13, 462–471, doi:10.3762/bjnano.13.39
Beilstein J. Nanotechnol. 2020, 11, 1371–1380, doi:10.3762/bjnano.11.121
Beilstein J. Nanotechnol. 2014, 5, 1873–1886, doi:10.3762/bjnano.5.198